EDFAS Virtual Workshop
December 07 - 09, 2020
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A Novel Deprocessing Technique for Revealing Transistor-level Damage on 7nm FinFET Devices
Tuesday, December 8, 2020: 4:15 PM
Mr. Fei Long Xu
,
Xilinx, Inc., San Jose, CA
Mr. Phoumra Tan
,
Xilinx, Inc, San Jose, CA
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Sample Prep and Device Deprocessing
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EDFAS Virtual Workshop