47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Basics and current aspects of scanning electron microscopy
Sunday, October 31, 2021: 2:20 PM
103 AB (Phoenix Convention Center)
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
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