47th International Symposium for Testing and Failure Analysis (Oct. 31

47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)

Sunday, October 31, 2021

8:00 AM-10:00 AM

Electrical and Yield I
Session Chair: Mr. Randal E. Mulder and Mr. Gregory Johnson

8:00 AM-11:50 AM

Package and Physical Analysis Challenges I
Session Chair: Dr. Wentao Qin and Mr. John Bescup

9:00 AM-2:00 PM

Fault Isolation I
Session Chair: Dr. Mayue Xie and Mr. Martin Igarashi

11:50 AM-12:30 PM

Lunch

12:30 PM-3:50 PM

Featured Talks
Session Chair: Mr. Lorenz Lechner and Mr. Corey Senowitz

Microscopy
Session Chair: Ms. Rose Ring and Mr. Dave Vallett

2:20 PM-3:50 PM

Electrical and Yield II
Session Chair: Mr. Randal E. Mulder and Mr. Gregory Johnson

3:50 PM-5:20 PM

Fault Isolation II
Session Chair: Dr. Mayue Xie and Mr. Martin Igarashi

3:50 PM-5:30 PM

Package and Physical Analysis Challenges II
Session Chair: Dr. Wentao Qin and Mr. John Bescup

Monday, November 1, 2021

8:00 AM-10:00 AM

Opening Session and EDFAS General Membership Meeting

10:00 AM-10:20 AM

Morning Refreshment Break

10:20 AM-12:15 PM

Emerging FA Techniques and Concepts
Session Chair: Dr. William Lo and Dr. Eckhard Langer

12:15 PM-1:30 PM

Lunch

1:30 PM-2:20 PM

Detecting and Preventing Counterfeit Microelectronics
Session Chair: Ms. Pamela C. Fagnani and Mr. Kevin Awai

Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Pai Tangyunyong

2:45 PM-3:00 PM

Afternoon Refreshment Break

3:00 PM-4:15 PM

Die Level Fault Isolation
Session Chair: Mr. Dan Bodoh and Ms. Lesly Endrinal

3:00 PM-4:30 PM

SiP and 3D Devices
Session Chair: Prof. Ingrid De Wolf and Ms. Kannu Wadhwa

4:15 PM-4:40 PM

Case Studies: FA Processes
Session Chair: Dr. Mike Bruce and Mr. Christopher Penley

5:00 PM-6:45 PM

Tools of the Trade Tour

7:00 PM-10:00 PM

Social Event: 810 Billiards & Bowling

Tuesday, November 2, 2021

8:30 AM-9:30 AM

Keynote Session: Dr. Ravi Mahajan

9:30 AM-10:10 AM

Morning Refreshment Break

10:10 AM-11:50 AM

AI Applications for FA I
Session Chair: Mr. Pascal Gounet and Dr. Joy Liao

Product Yield, Test & Diagnostics I
Session Chair: Mr. Rommel Estores and Mr. Jayant D'Souza

11:50 AM-1:15 PM

Lunch on the Expo Floor

1:15 PM-2:05 PM

AI Applications for FA II
Session Chair: Mr. Pascal Gounet and Dr. Joy Liao

Product Yield, Test & Diagnostics II
Session Chair: Mr. Rommel Estores and Mr. Jayant D'Souza

Wednesday, November 3, 2021

8:00 AM-9:40 AM

Case Studies: Device Analysis
Session Chair: Mr. Stephen Fasolino and Mr. Jeff Gambino

8:00 AM-10:05 AM

Sample Preparation and Device Deprocessing
Session Chair: Dr. Chuan Zhang and Dr. Erwin Hendarto

10:05 AM-10:35 AM

Morning Refreshment Break

10:35 AM-12:05 PM

Panel Discussion: Overcoming the Challenges in System-in-Package Failure Analysis

12:05 PM-1:05 PM

Lunch on the Expo Floor

1:05 PM-3:05 PM

Poster Session

2:15 PM-3:00 PM

Women in FA
Session Chair: Ms. Renee Parente and Mrs. Efrat Moyal

3:05 PM-5:20 PM

Contactless Probing and Nanoprobing User Group

FIB User Group

Thursday, November 4, 2021

8:00 AM-8:50 AM

Packaging and Assembly
Session Chair: Ms. Rose Ring

8:00 AM-9:40 AM

Hardware Attacks, Security, and Reverse Engineering
Session Chair: Dr. E.L. Principe and Mr. Kevin Awai

8:50 AM-9:15 AM

Packaging and Assembly

9:15 AM-9:40 AM

Board and System Level FA
Session Chair: Mr. Jason Wheeler and Mr. John Bescup

9:40 AM-9:50 AM

Morning Refreshment Break

9:50 AM-10:15 AM

FIB Circuit Analysis and Edit
Session Chair: Dr. Daminda Dahanayaka and Mr. Antonio Tollis

9:50 AM-11:55 AM

Nanoprobing, Electrical Characterization
Session Chair: David Albert and Mr. John Sanders

10:15 AM-11:45 AM

Microscopy
Session Chair: Ms. Rose Ring

12:20 PM-1:20 PM

Lunch

1:20 PM-3:50 PM

FIB Sample Preparation
Session Chair: Dr. Cathy Vartuli and Ms. Rose Ring

Microscopy and Material Characterization
Session Chair: Mr. Ryan Fredrickson and Dr. Lianfeng Fu