47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Ms. Susan Li
Director
Infineon
Failure Analysis Engineering
San Jose, CA
USA 95134
Papers:
Chip Scale Packaging and Its Failure Analysis Challenges
