47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Martin Búran
R&D Applications
TESCAN Brno s.r.o.
Brno Czech Republic 62300
Papers:
EMERGING FA TECHNIQUES AND CONCEPTS: Pairing Laser Ablation and Xe Plasma FIB-SEM: An approach for precise end-pointing in large-scale Physical Failure Analysis in the Semiconductor Industry