48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Mr. Richard Oldrey
IBM - STG-MD
Hopewell Junction, NY
USA 12533
Papers:
Investigation of Thermal Laser Stimulation (TLS) Effects on 7nm FinFET Transistor Parameters
