48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Mr. Richard H. Livengood
Intel Corporation
Santa Clara, NY
USA 95054
Papers:
An Introduction to the FIB (Focused Ion Beam) as a Microchip Circuit Edit Tool
Memory Array Debug strategies using FIB assisted Milling