Memory Array Debug strategies using FIB assisted Milling
Memory Array Debug strategies using FIB assisted Milling
Thursday, November 3, 2022: 9:50 AM
Ballroom A (Pasadena Convention Center)
Summary:
Memory array debug needs resolution down to the bit level and we have provided support for that to validate test fails using FIB assisted milling. In this presentation, we will present novel ways to use FIB assisted milling to use newly developed methodology to complete this debug in a more successful manner.
Memory array debug needs resolution down to the bit level and we have provided support for that to validate test fails using FIB assisted milling. In this presentation, we will present novel ways to use FIB assisted milling to use newly developed methodology to complete this debug in a more successful manner.