48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Ms. Chea Wee Lo
Infineon Technologies (Malaysia) Sdn Bhd
Melaka Malaysia 75350
Papers:
PACKAGING AND ASSEMBLY LEVEL FA: FA Methodology Comparison to Define Potential Root Cause on Lifted Copper Ball Bond
Develop a Time Efficient Method to Enhance the FIB Process on Die Backside Metallization (BSM) Analysis