48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Ms. Lesly Endrinal
San Diego, CA
USA 92121
Papers:
Electrical Fault Isolation for Functional and Logic Hard Failures Using Laser Voltage Imaging
DIE LEVEL FAULT ISOLATION: Logic State PEM Analysis for ATPG SCAN Logic Failure