DIE LEVEL FAULT ISOLATION: Logic State PEM Analysis for ATPG SCAN Logic Failure
DIE LEVEL FAULT ISOLATION: Logic State PEM Analysis for ATPG SCAN Logic Failure
Wednesday, November 2, 2022
Exhibit Halls A & B (Pasadena Convention Center)
Summary:
Logic State PEM methodology provide an alternate optical electrical fault isolation (EFI) solution to handle any ATPG SCAN logic failure part without conclusive EMMI finding, improve EFI confident level up to 100% & reduce physical fault analysis (PFA) area of interest (AOI) size especially on any critical Automotive returns & any Digital rejects across difference tech node.
Logic State PEM methodology provide an alternate optical electrical fault isolation (EFI) solution to handle any ATPG SCAN logic failure part without conclusive EMMI finding, improve EFI confident level up to 100% & reduce physical fault analysis (PFA) area of interest (AOI) size especially on any critical Automotive returns & any Digital rejects across difference tech node.
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