48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Dr. Konstantin Schekotihin
FA engineer
Infineon tech. AG
Neubiberg Germany 85579
Papers:
A BERT-based Report Classification for Semiconductor Failure Analysis
Automated Labeling Infrastructure for Failure Analysis
