A BERT-based Report Classification for Semiconductor Failure Analysis
A BERT-based Report Classification for Semiconductor Failure Analysis
Tuesday, November 1, 2022: 2:25 PM
Ballroom A (Pasadena Convention Center)
Summary:
In this paper, we investigate applications of modern Natural Language Processing (NLP) approaches, such as BERT-based networks, to the classification of FA texts with respect to electrical and/or physical failures they describe.
In this paper, we investigate applications of modern Natural Language Processing (NLP) approaches, such as BERT-based networks, to the classification of FA texts with respect to electrical and/or physical failures they describe.