Power Electronics Failure Analysis
Sunday, November 12, 2023: 1:30 PM
104 A-B (Phoenix Convention Center)
Mr. Greg Johnson
,
ZEISS Microscopy, Oberkochen, NY
Dr. Domenico Mello
,
STMicroelectronics, catania, Italy
Andreas Rummel
,
Kleindiek Nanotechnik, Reutlingen, Germany
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
N/A John Byrnes
,
Semilab, USA, North Billerica, MA
Dr. Shubhodeep Goswami
,
GE Global Research, , Niskayuna, NY
Mr. Hirotoshi Terada
,
Hamamatsu Photonics K.K., Hamamatsu, Shizuoka, Japan
