49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023): At-A-Glance
49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023): At-A-Glance
SATURDAY November 11
Technical Program
AM
-
Failure Analysis of Electronic Devices9:00 AM-1:00 PM
PM
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Beam Based Defect Localization1:00 PM-5:00 PM
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Registration Open5:00 PM-7:00 PM
SUNDAY November 12
Technical Program
AM
-
Sunday's Author's Coffee7:00 AM-8:00 AM
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Registration Open7:00 AM-5:00 PM
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Sunday's AM Break10:00 AM-10:20 AM
PM
-
Sunday's Lunch12:20 PM-1:30 PM
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Sunday's PM Break3:30 PM-3:50 PM
Tutorial
AM
-
Fault Isolation Tutorial I8:00 AM-10:00 AM
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Microscopy Tutorial I8:00 AM-10:00 AM
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Package and Physical Analysis Challenges Tutorial I8:00 AM-10:00 AM
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Fault Isolation Tutorial II10:20 AM-12:20 PM
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Microscopy Tutorial II10:20 AM-12:20 PM
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Package and Physical Analysis Challenges Tutorial II10:20 AM-12:20 PM
PM
-
Electrical and Yield Tutorial I1:30 PM-3:30 PM
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Microscopy Tutorial III1:30 PM-3:30 PM
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Other - Technology Specific and Featured Tutorial I1:30 PM-3:30 PM
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Electrical and Yield Tutorial II3:50 PM-4:50 PM
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Microscopy Tutorial IV3:50 PM-4:50 PM
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Other - Technology Specific and Featured Tutorial II3:50 PM-4:50 PM
MONDAY November 13
Technical Program
AM
-
Monday's Author's Coffee7:00 AM-8:00 AM
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Registration Open7:00 AM-5:00 PM
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Opening Session and EDFAS General Membership Meeting7:45 AM-10:00 AM
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Monday's AM Refreshment Break10:00 AM-10:20 AM
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Emerging FA Techniques and Concepts10:20 AM-11:00 AM
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FIB Circuit Analysis and Edit11:10 AM-11:50 AM
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Power Devices (Si, SiC, GaN) I11:10 AM-11:50 AM
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Monday's Lunch11:50 AM-12:50 PM
PM
-
User Group Session | FIB12:50 PM-2:20 PM
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Power Devices (Si, SiC, GaN) II1:20 PM-2:20 PM
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Monday's PM Refreshment Break2:20 PM-3:00 PM
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FIB Sample Preparation3:00 PM-4:00 PM
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Power Devices (Si, SiC, GaN) III3:00 PM-4:00 PM
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TOOLS OF THE TRADE TOUR5:00 PM-6:30 PM
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Social Event at 810 Billiards & Bowling7:00 PM-10:00 PM
Tutorial
PM
-
Other - Technology Specific and Featured Tutorial III4:00 PM-5:00 PM
-
Package and Physical Analysis Challenges Tutorial III4:00 PM-5:00 PM
TUESDAY November 14
Technical Program
AM
-
Tuesday's Author's Coffee7:00 AM-8:00 AM
-
Registration Open7:30 AM-6:30 PM
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Tuesday's AM Refreshment Break9:30 AM-10:10 AM
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Exhibit Hall Open9:30 AM-6:00 PM
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Wellness Lounge9:30 AM-6:00 PM
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AI Applications for Failure Analysis10:10 AM-11:30 AM
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Case Studies and Device Analysis10:10 AM-11:50 AM
-
Tuesday's Lunch11:50 AM-12:50 PM
PM
-
Case Studies: FA Process and Workflows I12:50 PM-2:10 PM
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User Group Session | AI1:50 PM-2:50 PM
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Packaging and Assembly2:10 PM-2:50 PM
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Tuesday's PM Refreshment Break2:50 PM-3:20 PM
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System in Package and 3D Devices3:20 PM-3:40 PM
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Case Studies: FA Process and Workflows II3:20 PM-4:40 PM
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User Group Session | SIP3:40 PM-4:40 PM
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Welcome Reception with Exhibitors4:30 PM-6:00 PM
Tutorial
PM
-
Other - Technology Specific and Featured Tutorial IV12:50 PM-1:50 PM
WEDNESDAY November 15
Student Poster Contest
PM
-
Student Poster Contest3:00 PM-4:00 PM
Technical Program
AM
-
Wednesday's Author's Coffee7:00 AM-8:00 AM
-
Registration Open7:30 AM-5:30 PM
-
Sample Preparation and Device Deprocessing8:00 AM-9:00 AM
-
Wednesday's AM Refreshment Break9:00 AM-9:30 AM
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Exhibit Hall Open9:00 AM-4:00 PM
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Wellness Lounge9:00 AM-4:00 PM
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Scanning Probe Analysis9:40 AM-10:20 AM
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Boards and Systems10:20 AM-11:00 AM
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Die Level Fault Isolation10:20 AM-12:00 PM
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User Group Session | Sample Preparation11:00 AM-12:00 PM
PM
-
Wednesday's Lunch12:00 PM-1:30 PM
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Women in Electronics Failure Analysis (WEFA)12:00 PM-1:30 PM
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Exhibitor Dessert Reception, Poster Session and Video Contest3:00 PM-4:00 PM
Tutorial
AM
-
Microscopy Tutorial V8:00 AM-9:00 AM
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Microscopy Tutorial VI9:40 AM-10:20 AM
PM
-
Microscopy Tutorial VII4:00 PM-5:00 PM
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Fault Isolation Tutorial III4:00 PM-5:30 PM
THURSDAY November 16
Technical Program
AM
-
Thursday's Author's Coffee7:00 AM-8:00 AM
-
Registration Open7:30 AM-1:00 PM
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Package Level Fault Isolation8:00 AM-9:20 AM
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Microscopy Analysis and Materials Characterization8:00 AM-10:00 AM
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Product Yield, Test, and Diagnostics9:20 AM-10:00 AM
-
Thursday's AM Refreshment Break10:00 AM-10:20 AM
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User Group Session | Optical Fault Isolation10:20 AM-11:20 AM
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Break11:20 AM-11:30 AM
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User Group Session | Nanoprobing11:30 AM-12:30 PM
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Detecting and Preventing Counterfeit Microelectronics11:50 AM-12:30 PM
PM
-
Thursday's Lunch12:30 PM-1:30 PM
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Nanoprobing and Electrical Characterization I1:30 PM-2:10 PM
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Hardware Attacks, Security, and Reverse Engineering I1:30 PM-2:30 PM
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Thursday's PM Refreshment Break2:30 PM-2:50 PM
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Nanoprobing and Electrical Characterization II2:50 PM-3:30 PM
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Hardware Attacks, Security, and Reverse Engineering II2:50 PM-3:50 PM
Tutorial
AM
-
Microscopy Tutorial VIII10:20 AM-11:20 AM