49th International Symposium for Testing and Failure Analysis (Nov. 12

49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)

Video Contest

Saturday, November 11, 2023

Sunday, November 12, 2023

7:00 AM-8:00 AM

Sunday's Author's Coffee

7:00 AM-5:00 PM

Registration Open

8:00 AM-10:00 AM

Fault Isolation Tutorial I
Session Chair: Dr. Lorenz Lechner and Mr. Robert Nesting

Microscopy Tutorial I
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Package and Physical Analysis Challenges Tutorial I
Session Chair: Mrs. Sarah Wozny

10:00 AM-10:20 AM

Sunday's AM Break

10:20 AM-12:20 PM

Fault Isolation Tutorial II
Session Chair: Dr. Lorenz Lechner and Mr. Robert Nesting

Microscopy Tutorial II
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Package and Physical Analysis Challenges Tutorial II
Session Chair: Mrs. Sarah Wozny

12:20 PM-1:30 PM

Sunday's Lunch

1:30 PM-3:30 PM

Electrical and Yield Tutorial I
Session Chair: Mr. Randal E. Mulder and Mr. Greg Johnson

Microscopy Tutorial III
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Other - Technology Specific and Featured Tutorial I
Session Chair: Prof. Umberto Celano and Dr. Cecile S. Bonifacio

3:30 PM-3:50 PM

Sunday's PM Break

3:50 PM-4:50 PM

Electrical and Yield Tutorial II
Session Chair: Mr. Randal E. Mulder and Mr. Greg Johnson

Microscopy Tutorial IV
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Other - Technology Specific and Featured Tutorial II
Session Chair: Dr. Umberto Celano and Dr. Cecile S. Bonifacio

Monday, November 13, 2023

7:00 AM-8:00 AM

Monday's Author's Coffee

7:00 AM-5:00 PM

Registration Open

7:45 AM-10:00 AM

Opening Session and EDFAS General Membership Meeting

10:00 AM-10:20 AM

Monday's AM Refreshment Break

10:20 AM-11:00 AM

Emerging FA Techniques and Concepts
Session Chair: Dr. Baohua Niu and Mr. Kah Chin Cheong

11:10 AM-11:50 AM

FIB Circuit Analysis and Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

Power Devices (Si, SiC, GaN) I
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

11:50 AM-12:50 PM

Monday's Lunch

12:50 PM-1:20 PM

INVITED TALK - Reliability Prediction for Wide Bandgap Power Devices, Professor Joseph Bernstein, Ariel University
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

12:50 PM-2:20 PM

User Group Session | FIB

1:20 PM-2:20 PM

Power Devices (Si, SiC, GaN) II
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

2:20 PM-3:00 PM

Monday's PM Refreshment Break

3:00 PM-4:00 PM

FIB Sample Preparation
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Power Devices (Si, SiC, GaN) III

4:00 PM-5:00 PM

Other - Technology Specific and Featured Tutorial III
Session Chair: Dr. Cecile Bonifacio Fittz and Dr. Umberto Celano

Package and Physical Analysis Challenges Tutorial III
Session Chair: Mrs. Sarah Wozny

5:00 PM-6:30 PM

TOOLS OF THE TRADE TOUR

7:00 PM-10:00 PM

Social Event at 810 Billiards & Bowling

Tuesday, November 14, 2023

7:00 AM-8:00 AM

Tuesday's Author's Coffee

7:30 AM-6:30 PM

Registration Open

8:30 AM-9:30 AM

Keynote Session: Wide band gap power devices and related robustness and reliability aspects: Dr. Peter Friedrichs, Vice President SiC Infineon

9:30 AM-10:10 AM

Tuesday's AM Refreshment Break

9:30 AM-6:00 PM

Exhibit Hall Open

Wellness Lounge

10:10 AM-11:30 AM

AI Applications for Failure Analysis
Session Chair: Dr. Yougui Liao and Dr. Sebastian Brand

10:10 AM-11:50 AM

Case Studies and Device Analysis
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

11:50 AM-12:50 PM

Tuesday's Lunch

12:50 PM-1:50 PM

Other - Technology Specific and Featured Tutorial IV
Session Chair: Dr. Umberto Celano and Dr. Cecile Bonifacio Fittz

12:50 PM-2:10 PM

Case Studies: FA Process and Workflows I
Session Chair: Dr. Wentao Qin and Dr. Juntao Li

1:50 PM-2:50 PM

User Group Session | AI

2:10 PM-2:50 PM

Packaging and Assembly
Session Chair: Mrs. Sarah Wozny and Mr. Robert Constantin

2:50 PM-3:20 PM

Tuesday's PM Refreshment Break

3:20 PM-3:40 PM

System in Package and 3D Devices
Session Chair: Mr. Joseph Caroselli and Mr. Pradip Sairam Pichumani

3:20 PM-4:40 PM

Case Studies: FA Process and Workflows II
Session Chair: Dr. Wentao Qin and Dr. Juntao Li

3:40 PM-4:40 PM

User Group Session | SIP

4:30 PM-6:00 PM

Welcome Reception with Exhibitors

Wednesday, November 15, 2023

7:00 AM-8:00 AM

Wednesday's Author's Coffee

7:30 AM-5:30 PM

Registration Open

8:00 AM-9:00 AM

Microscopy Tutorial V
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Sample Preparation and Device Deprocessing
Session Chair: Dr. Christopher H. Kang and Ms. Sylvia Lewis

9:00 AM-9:30 AM

Wednesday's AM Refreshment Break

9:00 AM-4:00 PM

Exhibit Hall Open

Wellness Lounge

9:40 AM-10:20 AM

Microscopy Tutorial VI
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Dr. Daminda Dahanayaka

10:20 AM-11:00 AM

Boards and Systems
Session Chair: Ms. Seraina Murphy and Mr. Stephen Fasolino

10:20 AM-12:00 PM

Die Level Fault Isolation
Session Chair: Mr. Dan Bodoh and Ms. Lesly Endrinal

11:00 AM-12:00 PM

User Group Session | Sample Preparation

12:00 PM-1:30 PM

Wednesday's Lunch

Women in Electronics Failure Analysis (WEFA)

1:30 PM-3:00 PM

Charging Forward: Navigating Reliability and Failures in Power Electronics Panel Discussion

3:00 PM-3:15 PM

Winner of the Walking Challenge Announced. Must be present to win! Sponsored by SIEMENS

3:00 PM-4:00 PM

Exhibitor Dessert Reception, Poster Session and Video Contest

Student Poster Contest

4:00 PM-5:00 PM

Microscopy Tutorial VII
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

4:00 PM-5:30 PM

Fault Isolation Tutorial III
Session Chair: Dr. Lorenz Lechner and Mr. Robert Nesting

Thursday, November 16, 2023

7:00 AM-8:00 AM

Thursday's Author's Coffee

7:30 AM-1:00 PM

Registration Open

8:00 AM-9:20 AM

Package Level Fault Isolation
Session Chair: Mr. Joseph Caroselli

8:00 AM-10:00 AM

Microscopy Analysis and Materials Characterization
Session Chair: Ms. Rose Ring and Dr. Cecile S. Bonifacio

9:20 AM-10:00 AM

Product Yield, Test, and Diagnostics
Session Chair: Mr. Jayant D'Souza and Dr. Shraddha Bodhe

10:00 AM-10:20 AM

Thursday's AM Refreshment Break

10:20 AM-11:20 AM

Microscopy Tutorial VIII
Session Chair: Ms. Rose Ring and Mr. Corey Senowitz

User Group Session | Optical Fault Isolation

11:20 AM-11:30 AM

Break

11:30 AM-12:30 PM

User Group Session | Nanoprobing

11:50 AM-12:30 PM

Detecting and Preventing Counterfeit Microelectronics
Session Chair: Mr. Maxwell Hamilton, Ms. Pamela C. Calica and Mr. Kevin Awai

12:30 PM-1:30 PM

Thursday's Lunch

1:30 PM-2:10 PM

Nanoprobing and Electrical Characterization I
Session Chair: Mr. David Albert and Mr. John Sanders

1:30 PM-2:30 PM

Hardware Attacks, Security, and Reverse Engineering I
Session Chair: Mr. Kevin Awai and Dr. Mike Bruce

2:30 PM-2:50 PM

Thursday's PM Refreshment Break

2:50 PM-3:30 PM

Nanoprobing and Electrical Characterization II
Session Chair: Mr. David Albert and Mr. John Sanders

2:50 PM-3:50 PM

Hardware Attacks, Security, and Reverse Engineering II
Session Chair: Mr. Kevin Awai and Dr. Mike Bruce