49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Mr. Michael Wong
Intel
Fremont, CA
USA N/A
Papers:
An Introduction to the FIB (Focused Ion Beam) as a Microchip Circuit Edit Tool
Fundamental Considerations in the Justification, Design & Construction of an Analytical Laboratory for High Tech Imaging & Processing Tools.