49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Ms. Chiun Ning Liew
Product Development Engineer (FAFI)
Intel
San Jose, CA
USA 95131
Papers:
Effective Fault Localization Approach for High Speed Transceiver Failure: From Non-destructive to Destructive
