Enhancing Soft Defect Localization with Software Automated Intelligent Laser Scanning (SAILS)

Wednesday, October 30, 2024: 11:20 AM
The Pointe (Hilton San Diego Bayfront)
Mr. Arun Karunanithi , Advanced Micro Devices, Inc., Austin, TX
Mr. Aaron Liao , The University of Texas at Austin, Austin, TX
Mr. Joseph Caroselli , Advanced Micro Devices, Inc., Austin, TX
Mr. Winston Gao , Advanced Micro Devices, Inc., Austin, TX

See more of: Die Level Fault Isolation
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