Technical Program

Sunday, October 27, 2024

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8:30 AM-12:30 PM


Failure Analysis of Electronic Devices Education Course (Registration Required)

1:30 PM-5:30 PM


Beam Based Defect Localization Education Course (Registration Required)

5:00 PM-7:00 PM


Registration Open

Monday, October 28, 2024

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7:00 AM-8:00 AM


Monday's Author's Coffee/Briefing

7:00 AM-5:00 PM


Registration Open

Tuesday, October 29, 2024

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7:00 AM-7:45 AM


Continental Breakfast

7:00 AM-8:00 AM


Tuesday's Authors Coffee/Briefing

7:00 AM-5:00 PM


Registration Open

8:00 AM-9:45 AM


Opening Session & EDFAS General Membership Meeting

9:45 AM-10:00 AM


Tuesday Morning Refreshment Break

10:00 AM-10:45 AM


FA Roadmap Keynote: Marla Dowell, Director of CHIPS Metrology Program and NIST Boulder Laboratory

10:45 AM-12:15 PM


FA Roadmap Session

12:15 PM-1:20 PM


Tuesday's Lunch

1:20 PM-2:50 PM


Case Studies: FA Process and workflows
Session Chair: Mr. Kah Chin Cheong and Narang Vinod

Emerging FA Techniques and Concepts I
Session Chair: Mr. Kent Erington and Dr. Mike bruce

Power Devices (Si, SiC, GaN)
Session Chair: Dr. Aidan Taylor and Dr. Baohua Niu

2:40 PM-3:00 PM


Tuesday Afternoon Refreshment Break

3:00 PM-4:20 PM


Emerging FA Techniques and Concepts II
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

Sample Preparation and Device De-processing
Session Chair: Dr. Chris kang and Ms. Rose Ring

4:20 PM-4:40 PM


Invited Talk: Dr. Zhi Yang, Groq, presents, “AI-Driven Packaging Design: Accelerating Reliability through Smart Data Integration and Optimization”.
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

4:45 PM-6:15 PM


Tools of the Trade Tour

6:30 PM-9:30 PM


50th Anniversary Beachside Luau Bash – Social Networking Event (Tickets Required)

Wednesday, October 30, 2024

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7:00 AM-8:00 AM


Wednesday's Author Coffee/Briefing

7:30 AM-5:30 PM


Registration Open

8:00 AM-8:30 AM


Invited Talk: Ed Cole, Sandia, & Christian Boit, Retired, presents "50 years of ISTFA".

8:30 AM-9:30 AM


Keynote: Dr. James Chambers, Vice President of Silicon Engineering and Sourcing, NVIDIA

9:30 AM-10:00 AM


Wednesday Morning Refreshment Break

9:30 AM-6:00 PM


Exhibit Hall Open

10:00 AM-10:20 AM


FIB Circuit Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

10:00 AM-11:20 AM


OFI/Test/Diagnosis User Group Discussion

Package Level Fault Isolation
Session Chair: Ms. Sylvia Lewis and Ms. Susan Li

10:20 AM-12:00 PM


FIB Sample Preparation
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

11:20 AM-12:00 PM


Die Level Fault Isolation
Session Chair: Ms. Lesly Endrinal and Mr. DAN bodoh

Invited Talk: Manuel Stabentheiner, Infineon Technologies Austria AG, presents, “Failure analysis of GaN-on-Si power devices – challenges, workflows and test concepts”.
Session Chair: Ms. Sylvia Lewis and Ms. Susan Li

12:00 PM-1:00 PM


Wednesday's Lunch

1:00 PM-1:40 PM


Invited Talk: Majid Vaghayenegar, ThermoFisher Scientific, presents, "Meeting Current and Future Challenges on Advanced Circuit Edit Technologies".
Session Chair: Jayant D'Souza and Mr. Saidapet Ramesh

Invited Talk: Raj Sankaralingham, Texas Instruments, presents, "ESD Design, Testing and Debug".
Session Chair: Jayant D'Souza and Mr. Saidapet Ramesh

1:00 PM-2:00 PM


Nanoprobing/Scanning Probe User Group Discussion

1:40 PM-2:00 PM


Product Yield, Test and Diagnostics
Session Chair: Mr. Jayant D'Souza and Mr. Saidapet Ramesh

1:40 PM-2:40 PM


Boards and Systems
Session Chair: Mr. Stephen Fasolino and Ms. Bernice Zee

2:00 PM-2:40 PM


Hardware Security & Counterfeiting
Session Chair: Mr. Kevin Awai and Allen Gabat

Invited Talk: Jayant D'Souza, Seimens, presents, "Improved Diagnosis Methods for the Era of Back Side Power"
Session Chair: Ms. Lesly Endrinal

2:40 PM-3:00 PM


Wednesday Afternoon Refreshment Break

3:00 PM-3:40 PM


Invited Talk: Mike Campbell, Qualcomm, presents, "Starting a Lab from Scratch"
Session Chair: Ms. Lesly Endrinal

3:00 PM-4:00 PM


Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Dr. Daminda Dahanayaka

3:00 PM-4:40 PM


Focused Ion Beam User Group Discussion

4:00 PM-4:40 PM


Invited Talk: Ingrid De Wolf, IMEC and KU Leuven, presents, "Failure Analysis in a Nanoelectronics Research Center: Challenges and Opportunities"
Session Chair: Ms. Lesly Endrinal

4:30 PM-6:00 PM


50 Years of Innovation Exhibitor Reception

Thursday, October 31, 2024

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7:00 AM-8:00 AM


Thursday's Author Coffee/Briefing

7:30 AM-6:30 PM


Registration Open

8:00 AM-9:00 AM


Case Studies: Device Analysis
Session Chair: Mr. Greg johnson and Dr. Yuyan Wang

Sample Preparation User Group Discussion

8:00 AM-9:40 AM


AI Applications for Failure Analysis
Session Chair: Dr. Sebastian Brand and Mr. Michael Koegel

9:00 AM-9:20 AM


Invited Talk - James Vickers, Thermo Fisher, presents, "Electron-Beam Probing of Modern Integrated Circuits: Moving Forward While Borrowing From The Past"
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

9:00 AM-9:40 AM


More Than Moore: Si-Photonics, Magnetics, Magneto-Optics, Biosensors, Quantum Computing, 2D Materials, SQUID etc.
Session Chair: Dr. Ricky Anthony and Dr. William Lo

9:30 AM-4:00 PM


Exhibit Hall Open

9:40 AM-10:00 AM


Thursday Morning Refreshment Break

10:00 AM-10:20 AM


Invited Talk: Daljin Yoon, SK hynix Inc., presents, "A Study on the corrosion mechanism and effective factors in front and back end process of NAND".
Session Chair: Yan Li

10:00 AM-11:20 AM


Microscopy Analysis and Material Characterization
Session Chair: Ms. Seraina Murphy and Dr. Cecile Bonifacio

10:00 AM-11:40 AM


Artificial Intelligence User Group Discussion

10:20 AM-11:00 AM


Invited Talk - Steven Herschbein, presents, "The CHIPS Act and its Impact on the Semiconductor Industry and Analytical Labs".
Session Chair: Mr. Greg Johnson

11:40 AM-1:00 PM


Thursday's Lunch

12:00 PM-1:00 PM


Women in Electronics Failure Analysis (WEFA)

1:00 PM-2:30 PM


Artificial Intelligence in Electronic Failure Analysis Panel Discussion

2:30 PM-3:45 PM


ISTFA Turns 50: Sweetening the Celebration

Poster Session

Friday, November 1, 2024

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7:00 AM-8:00 AM


Friday's Author Coffee/Briefing

7:30 AM-11:00 AM


Registration Open

8:00 AM-9:40 AM


System in Package and 3D Devices
Session Chair: Dr. Christian Schmidt and Mr. Neel leslie

8:00 AM-10:00 AM


Nanoprobing, Electrical Characterization I
Session Chair: Mr. Dave Albert and Mr. JOHN sanders

9:40 AM-10:40 AM


System in Package (SiP) User Group Discussion

10:00 AM-10:20 AM


Invited Talk: Andrew Jonathan Smith, Kleindiek Nanotechnik, presents, "Advances in SEM-based Nanoprobing Techniques".
Session Chair: Mr. David Albert and Mr. John Sanders