50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Dr. Stephan Kleindiek
CEO
Kleindiek Nanotechnik
Reutlingen Germany 72770
Papers:
Combining Electrical Fault Isolation and Characterization Inside an SEM to Locate and Characterize Gate Leakages on a 3 nm Device
Advanced Nanoprobing and in situ sample exchange!