Dr. Matthias Kemmler

Kleindiek Nanotechnik
Reutlingen Germany 72770

Papers:

Enhancing Semiconductor Nanoprobing Procedures with AI-Driven Tip Detection
Combining Electrical Fault Isolation and Characterization Inside an SEM to Locate and Characterize Gate Leakages on a 3 nm Device
Advanced Nanoprobing and in situ sample exchange!