50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Mrs. Jennifer Huening
Engineer
Intel Corp.
Hillsboro, OR
USA 97124
Papers:
E-Beaming Probing and E-beam-Assisted Devices Alteration (EADA) for Fault Isolation in PowerVia and Advanced Technology Nodes