E-beam Probing and E-beam-Assisted Device Alteration (EADA) for Fault Isolation in PowerVia and Advanced Technology Nodes

Tuesday, October 29, 2024: 4:00 PM
202 (Hilton San Diego Bayfront)
Mrs. Jennifer Huening , Intel Corporation, Hillsboro, OR
Dr. Tom X. Tong , Intel Corporation, Hillsboro, OR
Mr. Shuai Zhao , Intel Corporation, Hillsboro, OR
Mr. Ravishankar thirugnanasambandam , Intel Corporation, Hillsboro, OR
Dr. Yunfei Wang , Intel Corporation, Hillsboro, OR
Dr. Hyuk Ju Ryu , Intel Corporation, Hillsboro, OR
Dr. Prasoon Joshi , Intel Corporation, Hillsboro, OR
Dr. Mitchell J. Senger , Intel Corporation, Hillsboro, OR
Ms. May Ling Oh , Intel Corporation, Hillsboro, OR
Dr. Renliang Yuan , Intel Corporation, Hillsboro, OR
Mr. Jacob Waelder , Intel Corporation, Hillsboro, OR
Mr. Anil matte , Intel Corporation, Hillsboro, OR
Dr. Baohua Niu , Intel Corporation, Hillsboro, OR
Dr. Zhiyong Ma , Intel Corporation, Hillsboro, OR
Mr. Neel Leslie , Thermo Fisher Scientific, Fremont, CA
Dr. James S. Vickers , Thermo Fisher Scientific, Fremont, CA