50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Dr. James S. Vickers
J
Thermo Fisher Scientific
Fremont, CA
USA 94538
Papers:
E-beam Probing and E-beam-Assisted Device Alteration (EADA) for Fault Isolation in PowerVia and Advanced Technology Nodes
Recent Advancements with Electron-Beam Probing of Modern Integrated Circuits