Dr. Sebastian Brand

Team Leader
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle, Saxony-Anhalt
Germany 6120

Papers:

Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies

Defect localization by Acoustic Microscopy

Exploring the effectiveness of combining Electron-Beam Probing and Optical Techniques in a 16nm technology device