50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Mr. Mark W McKinnon
Sales Director
JIACO Instruments
Delft Netherlands 2628CT
Papers:
Optimizations and Case Studies: Decapsulation of Hardened Epoxy SiC MOSFETs and Diodes via JIACO Microwave Induced Plasma Etching
Etched Away