Dr. Flavio Cognigni

Ph.D student
Carl Zeiss SpA
Dept. of Basic and Applied Sciences for Engineering (SBAI)
Milan Italy 20156

Papers:

Integrating Multimodal Microscopy and Artificial Intelligence Solutions for Laser Dicing Process Induced Defect Identification
Few-shot AI segmentation of semiconductor device FIB-SEM tomography data
AI-driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis