50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)

October 28 - November 1, 2024

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Mr. Keying Lin

Failure analysis engineer
NXP Semiconductors
PDC
Nijmegen Netherlands 6534 AE

Papers:

RF-LIT use case studies

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General Information

October 28 - November 1, 2024

San Diego, CA