50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)

October 28 - November 1, 2024

Home
Start
Browse
- Browse by Day
At-A-Glance
Author Index

Mr. Pieter Gommers

Failure analysis engineer
NXP Semiconductors
PDC
Nijmegen Netherlands 6534 AE

Papers:

RF-LIT use case studies

Home
Start
Browse
- Browse by Day
At-A-Glance
Author Index

General Information

October 28 - November 1, 2024

San Diego, CA