Electrical and Yield I

Monday, October 28, 2024: 1:20 PM-3:20 PM

202 (Hilton San Diego Bayfront)

Mr. Greg johnson, Zeiss Microscopy and Dr. Sam Subramanian, NXP Semiconductors

1:20 PM

Yield Basics for Failure Analysts
Mr. David Albert, IBM (Supplemental); Mr. Tracy Myers, ON Semiconductor

2:20 PM

The Fundamentals of Nanoprobe Analysis
Mr. Randy Mulder, Silicon Labs

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