Microscopy III

Monday, October 28, 2024: 1:20 PM-3:20 PM
The Pointe (Hilton San Diego Bayfront)
Mr. Steven Herschbein, Consultant, Mr. Randy Mulder, Silicon Labs, Mr. Libor Strakos, Thermo Fisher Scientific and Mr. Alejandro Bonilla, Park Systems, Inc.
1:20 PM
Advanced FIB/SEM Techniques for Sample Preparation and Analysis
Dr. Sam Subramanian, NXP Semiconductors; Mr. Eric Yi, NXP Semiconductors
2:20 PM
Basics and Current Aspects of Scanning Electron Microscopy
Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH
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