Opening Session & EDFAS General Membership Meeting
Join us to hear the IPFA and ESREF Best Papers; hear the President report on the current status of and future vision for EDFAS; and to meet the new EDFAS Officers and Board members. We look forward to seeing you there! The meeting is open to all EDFAS members, exhibitors and interested prospective members.
IPFA Best Paper: Zi-Ying Oh, AMD Singapore, presents "Improved Defect Detection of Advanced Semiconductor Packaging in Acoustic Imaging".
Zi-Ying Oh, AMD Singapore, Shao-Qian Chong, NTU Singapore, Arya S Nair, PVA TePla Germany, Bernice Zee, AMD Singapore
ESREF Best Paper: Leo Mischler, STMicroelectronics, presents, "Investigating the degradation mechanisms of moisture on the reliability of integrated low-k stack".
L. Mischlera, V. Cartaillera, G. Imbert, G. Duchamp and H. Frémont from STMicroelectronics, Crolles, France and IMS Laboratoire, Université de Bordeaux, Bordeaux, France