Invited Talk: Ingrid De Wolf, IMEC and KU Leuven, presents, "Failure Analysis in a Nanoelectronics Research Center: Challenges and Opportunities"
Professor, Fellow at IMEC
IMEC and KU Leuven
Title: “Failure analysis in a nanoelectronics research center: Challenges and opportunities”
Abstract:
In this talk, it is shown that the need for failure analysis (FA) tools in a nanoelectronics research center, such as imec, strongly depends on the research focus. For many years, there was a limited need because research was focusing on development of new devices. Nevertheless, some FA tools were available, mainly to gain insight in the physics of failure in a single device. This slowly changed with the introduction of 3D technology, which demanded for new FA solutions. This demand is still strong, due to the decrease of dimensions and the development of the back-side power delivery network. This talk will give a short overview of challenges and opportunities that were encountered during the years, using examples from papers published at ISTFA.
Biography:
Ingrid De Wolf received the PhD in Physics from the KU Leuven in 1989. In the same year she joined IMEC, where she worked on microelectronics reliability, with special attention for mechanical stress analysis using micro-Raman spectroscopy, and failure analysis. From 1999 to 2014, she headed the group REMO, where research is focused on reliability, test and modelling of 3D technology, interconnect, OIO, MEMS and packaging. She is currently fellow at IMEC, part-time professor at the faculty of engineering science, department of Materials Engineering of the KU Leuven and program director of the master nanotechnology at the same faculty. She (co-)authored more than 550 publications and won several best paper awards.
Ms. Lesly Endrinal, Google LLC