51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 15 - 20, 2025
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AI-driven 3D EM Tomography for Failure Analysis
Wednesday, November 19, 2025: 3:40 PM
Exhibit Hall A&B (Pasadena Convention Center)
Dr. Flavio Cognigni
,
Carl Zeiss SpA, Milan, ., Italy
Dr. Domenico Mello
,
EM Microelectronic, a Company of the Swatch Group, Marin-Epagnier, Switzerland
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
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See more of:
Video Contest