51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)

Sunday, November 16, 2025

7:00 AM-8:00 AM

Author's Coffee

8:00 AM-9:00 AM

Microscopy - TEM
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Package and Physical Analysis - Flip Chip
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen

Tech. Specific & Featured - Machine Learning
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

9:00 AM-10:00 AM

Microscopy - TEM Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Package and Physical Analysis - Chip Scale
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen

Tech. Specific & Featured - SRAM
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

10:00 AM-10:20 AM

Morning Refreshment Break

10:20 AM-11:20 AM

Fault Isolation - CSAM I
Session Chair: Dr. Mike Bruce

Microscopy - SEM Basics
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Lab Construction
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

11:20 AM-12:20 PM

Fault Isolation - Lock-in Thermography
Session Chair: Dr. Mike Bruce

Microscopy - TEM Imag w/SEM Diffraction
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Intro to FIB
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

12:20 PM-1:30 PM

Lunch

1:30 PM-2:30 PM

Electrical & Yield - Nanoprobe
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Fault Isolation - CSAM II
Session Chair: Dr. Mike Bruce

Microscopy - SEM Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

2:30 PM-3:30 PM

Electrical & Yield - MOSFET Testing
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Microscopy - FIB Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Analog Sim
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

3:30 PM-3:50 PM

Afternoon Refreshment Break

3:50 PM-4:50 PM

Electrical & Yield - Yield Basics
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Microscopy - AFM in SEM
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

3:50 PM-5:20 PM

Fault Isolation - LADA/SDL
Session Chair: Dr. Mike Bruce

Monday, November 17, 2025

10:20 AM-11:00 AM

Emerging FA Techniques and Concepts I
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

10:20 AM-11:10 AM

FIB Sample Preparation I
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Product Yield, Test and Diagnostics
Session Chair: Jayant D'Souza and Dr. Venkat Ravikumar

11:10 AM-11:20 AM

Break

11:20 AM-12:00 PM

Emerging FA Techniques and Concepts II
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

FIB Sample Preparation II
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Mr. Daminda Dahanayaka

12:10 PM-1:40 PM

FIB User Group Discussion & Lunch

Nanoprobing / SPM User Group Discussion & Lunch

1:40 PM-2:40 PM

FIB Sample Preparation III
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Microscopy Analysis and Material Characterization I
Session Chair: Dr. Cecile S. Bonifacio and Prof. Rosine COQ GERMANICUS

Package Level Fault Isolation
Session Chair: Sylvia Lewis and Ms. Susan Li

2:40 PM-3:00 PM

Afternoon Refreshment Break

3:00 PM-4:00 PM

FIB Sample Preparation IV
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Microscopy Analysis and Material Characterization II
Session Chair: Dr. Cecile S. Bonifacio and Prof. Rosine COQ GERMANICUS

3:00 PM-4:30 PM

Fault Isolation - Diag SoC
Session Chair: Dr. Mike Bruce

4:00 PM-4:40 PM

FIB Circuit Analysis & Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

4:00 PM-5:00 PM

System in Package and 3D Devices
Session Chair: Mr. Neel Leslie and Kevin Distelhurst

5:00 PM-6:30 PM

Expo - Tools of the Trade Tour

6:30 PM-9:30 PM

Social Networking Event (Tickets Required)

Tuesday, November 18, 2025

7:00 AM-8:00 AM

Author's Coffee

8:30 AM-9:30 AM

ISTFA Keynote Speaker: Dr. Liwei Wang, Senior Director of Heterogeneous Integration Foundry Technology Development, AMD

9:30 AM-10:30 AM

Morning Refreshment Break

9:30 AM-6:00 PM

Exhibit Open Hours

10:30 AM-11:50 AM

AI Applications for Failure Analysis I
Session Chair: Dr. Sebastian Brand and Zachary Eich

Device Analysis - Case Studies I
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

FA Process: Fault Isolation, Mechanisms, & Solutions I
Session Chair: Mr. Kah Chin Cheong and Vinod Narang

11:50 AM-12:50 PM

Lunch on the Expo Floor

12:50 PM-1:30 PM

FA Process: Fault Isolation, Mechanisms, & Solutions II
Session Chair: Mr. Kah Chin Cheong and Vinod Narang

12:50 PM-2:10 PM

Device Analysis - Case Studies II
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

12:50 PM-2:50 PM

AI Applications for Failure Analysis II
Session Chair: Dr. Sebastian Brand and Zachary Eich

1:30 PM-2:30 PM

Nanoprobing & Electrical Characterization I
Session Chair: David Albert and Mr. John Sanders

2:10 PM-2:50 PM

The Capital Equipment Buying Journey in FA Labs
Session Chair: Efrat Moyal and Sarah Poehlmann

2:50 PM-3:20 PM

Afternoon Refreshment Break

3:20 PM-4:20 PM

Microscopy - Charged Particle
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Nanoprobing & Electrical Characterization II
Session Chair: David Albert and Mr. John Sanders

3:20 PM-4:50 PM

AI User Group Discussion

4:30 PM-6:00 PM

Welcome Reception with Exhibitors

Wednesday, November 19, 2025

7:00 AM-8:00 AM

Author's Coffee

8:00 AM-9:00 AM

Microscopy - Atomic Probe Tomography
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Microscopy - STEM EBIC
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Power Devices (Si, SiC, GaN)
Session Chair: Dr. Chris Kang and Baohua Niu

9:00 AM-9:30 AM

Morning Refreshment Break

9:00 AM-10:30 AM

Sample Prep User Group Discussion

9:00 AM-4:00 PM

Exhibit Open Hours

10:30 AM-11:30 AM

ISTFA Keynote Speaker: Steven Herschbein, Independent Consultant, (IBM/GFS Retired)

11:30 AM-12:30 PM

Lunch on the Expo Floor

12:30 PM-1:30 PM

Women in Failure Analysis Session

1:30 PM-3:00 PM

Panel Discussion: Scaling Beyond Moore’s Law: Heterogeneous Computing and Advanced Packaging

3:00 PM-4:00 PM

Expo Floor - Dessert Reception, Poster Session, and Video Contest

Poster Session

Student Poster Session

Video Contest

Thursday, November 20, 2025

7:00 AM-8:00 AM

Author's Coffee

8:00 AM-8:40 AM

Boards and System Level FA
Session Chair: Mr. Stephen Fasolino and Ms. Bernice Zee

More Than Moore: Si-Photonics, Magnetics, Magneto-Optics, Biosensors, Quantum Computing, 2D Materials, SQUID etc.
Session Chair: Dr. Ricky Anthony and Dr. William Lo

8:40 AM-9:40 AM

Die Level Fault Isolation I
Session Chair: Ms. Lesly Endrinal and Mr. Dan Bodoh

Microscopy - Spectrometers
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

9:40 AM-10:00 AM

Morning Refreshment Break

10:00 AM-11:00 AM

Die Level Fault Isolation II
Session Chair: Ms. Lesly Endrinal and Mr. Dan Bodoh

10:00 AM-11:20 AM

Sample Preparation and Device De-processing I
Session Chair: Rosalinda Ring and Dr. Zachary Lingley

11:20 AM-12:50 PM

OFI User Group Discussion & Lunch

SIP User Group Discussion

12:50 PM-1:30 PM

Sample Preparation and Device De-processing II
Session Chair: Rosalinda Ring and Dr. Zachary Lingley

12:50 PM-2:10 PM

Hardware Security and Counterfeiting
Session Chair: Mr. Kevin Awai and Ms. Pamela Calica