51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)

Sunday, November 16, 2025

8:00 AM-9:00 AM

Microscopy - TEM

Package and Physical Analysis - Flip Chip

Tech. Specific & Featured - Machine Learning

9:00 AM-10:00 AM

Microscopy - TEM Sample Prep

Package and Physical Analysis - Chip Scale
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen

Tech. Specific & Featured - SRAM

12:20 PM-1:30 PM

Lunch

1:30 PM-2:30 PM

Electrical & Yield - Nanoprobe

Fault Isolation - CSAM II

Microscopy - SEM Sample Prep

2:30 PM-3:30 PM

Electrical & Yield - MOSFET Testing

Microscopy - FIB Sample Prep

Tech. Specific & Featured - Analog Sim
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

3:30 PM-3:50 PM

Refreshment Break

3:50 PM-4:50 PM

Electrical & Yield - Yield Basics
Session Chair: Mr. Greg Johnson, STEFANIE BOURBON and Dr. Bryan Tracy, PhD

Microscopy - AFM in SEM

3:50 PM-5:20 PM

Fault Isolation - LADA/SDL

Monday, November 17, 2025

7:45 AM-10:00 AM

Opening Session - Best Paper, ESREF, IPFA Update & EDFAS General Meeting

10:00 AM-10:20 AM

Refreshment Break

10:20 AM-11:00 AM

Emerging FA Techniques and Concepts I
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

10:20 AM-11:20 AM

FIB Sample Preparation I
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Package Level Fault Isolation
Session Chair: Sylvia Lewis and Ms. Susan Li

11:20 AM-11:30 AM

Break

11:30 AM-12:10 PM

Emerging FA Techniques and Concepts II

FIB Sample Preparation II

Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Mr. Daminda Dahanayaka

12:10 PM-1:40 PM

FIB User Group Discussion & Lunch

Nanoprobing / SPM User Group Discussion & Lunch

1:40 PM-2:40 PM

FIB Sample Preparation III

Microscopy Analysis and Material Characterization I
Session Chair: Dr. Cecile S. Bonifacio and Prof. Rosine COQ GERMANICUS

2:40 PM-3:00 PM

Refreshment Break

3:00 PM-4:00 PM

FIB Sample Preparation IV

Microscopy Analysis and Material Characterization II

3:00 PM-4:30 PM

Fault Isolation - Diag SoC
Session Chair: Dr. Michael Bruce

4:00 PM-4:40 PM

FIB Circuit Analysis & Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

4:00 PM-5:00 PM

Product Yield, Test and Diagnostics
Session Chair: Jayant D'Souza and Dr. Venkat Ravikumar

5:00 PM-6:30 PM

Expo - Tools of the Trade Tour

6:30 PM-9:30 PM

Social Event

Tuesday, November 18, 2025

8:30 AM-9:30 AM

ISTFA Keynote Speaker: Dr. Raja Swaminathan, Corporate Vice President of Heterogenous Integration Technologies, AMD

9:30 AM-10:00 AM

Expo Break

9:30 AM-6:30 PM

Exhibit Open Hours

10:00 AM-10:30 AM

Chips Act Update

10:30 AM-11:50 AM

AI Applications for Failure Analysis I
Session Chair: Dr. Sebastian Brand and Zachary Eich

Device Analysis - Case Studies I
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

FA Process: Fault Isolation, Mechanisms, & Solutions I
Session Chair: Mr. Kah Chin Cheong and Vinod Narang

11:50 AM-12:50 PM

Expo Floor Lunch

12:50 PM-1:30 PM

FA Process: Fault Isolation, Mechanisms, & Solutions II

12:50 PM-2:10 PM

Device Analysis - Case Studies II

12:50 PM-2:50 PM

AI Applications for Failure Analysis II

1:30 PM-2:30 PM

Nanoprobing & Electrical Characterization I
Session Chair: David Albert and Mr. John Sanders

2:10 PM-2:30 PM

The Capital Equipment Buying Journey in FA Labs

2:50 PM-3:20 PM

Expo Refreshment Break

3:20 PM-4:20 PM

Microscopy - Charged Particle

Nanoprobing & Electrical Characterization II

3:20 PM-4:50 PM

AI User Group Discussion

4:30 PM-6:00 PM

Welcome Reception with Exhibitors

Wednesday, November 19, 2025

8:00 AM-9:00 AM

Microscopy - Atomic Probe Tomography

Microscopy - STEM EBIC

Power Devices (Si, SiC, GaN)
Session Chair: Dr. Chris Kang and Baohua Niu

9:00 AM-9:30 AM

Refreshment Break

9:00 AM-10:30 AM

SIP User Group Discussion

9:00 AM-4:00 PM

Exhibit Open Hours

10:30 AM-11:30 AM

IRFA Keynote Speaker - Dr. Shida Tan

11:20 AM-11:40 AM

Expo Break

11:50 AM-1:20 PM

Lunch

Women in Failure Analysis Session & Lunch

1:10 PM-1:30 PM

Expo Break

1:30 PM-3:00 PM

Panel Discussion

3:00 PM-4:00 PM

Dessert Reception & Poster Session

Expo Floor - Poster Session

Poster Session

Student Poster Session

Video Contest

Thursday, November 20, 2025

8:00 AM-8:40 AM

Boards and System Level FA
Session Chair: Mr. Stephen Fasolino and Ms. Bernice Zee

More Than Moore: Si-Photonics, Magnetics, Magneto-Optics, Biosensors, Quantum Computing, 2D Materials, SQUID etc.
Session Chair: Dr. Ricky Anthony and Dr. William Lo

8:40 AM-9:40 AM

Die Level Fault Isolation I
Session Chair: Ms. Lesly Endrinal and Mr. Dan Bodoh

Microscopy - Spectrometers
Session Chair: Ms. Rose Ring, Mr. Randy Mulder and Dr. Pawel Nowakowski

9:40 AM-10:00 AM

Refreshment Break

10:00 AM-11:00 AM

Die Level Fault Isolation II

Sample Preparation and Device De-processing I
Session Chair: Ms. Rose Ring and Dr. Zachary Lingley

11:20 AM-12:50 PM

OFI User Group Discussion & Lunch

Sample Prep User Group Discussion & Lunch

12:50 PM-1:30 PM

Sample Preparation and Device De-processing II

12:50 PM-2:10 PM

Hardware Security and Counterfeiting
Session Chair: Mr. Kevin Awai and Ms. Pamela Calica

1:30 PM-2:10 PM

System in Package and 3D Devices
Session Chair: Mr. Neel Leslie and Kevin Distelhurst