E-beam Induced Conductive AFM for Advanced Semiconductor Characterization
Wednesday, November 19, 2025
Mr. Eduard Jelínek
,
Brno University of Technology, Brno, Brno-střed, Czech Republic
Mr. Ondřej Novotný
,
NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic
Mr. Md Ashiqur Rahman Laskar
,
Arizona State University, Tempe, AZ
Prof. Umberto Celano
,
Arizona State University, Tempe, AZ
Dr. Jan Neuman
,
NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic
