51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Dr. Joy Liao
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050
Papers:
Hyper-Integrated CAD Database for One-Shot EOTPR Fault Localization in Heterogeneous SiP-on-Board Assemblies