Ms. Amrutha Sampath

Electrical Failure Analysis Engineer
NXP Semiconductors
Austin Product Diagnostic Center
Austin, TX
USA 78735

Papers:

LADA and SDL: Powerful Techniques for Marginal Failures
Electrical Failure Analysis of Speckled Shmoo and Shmoo Stripping failures
Effectiveness of Photon Emission Microscopy in identifying intrinsic device reliability issues and aiding design debug