Dr. Chen Li

TEM application scientist
Thermo Fisher Scientific
Eindhoven, North Brabant
Netherlands 5651 GH

Papers:

A novel beam-tilt technique in transmission electron microscopy (TEM): application for semiconductor use cases
AI Applications for Failure Analysis - Grain size analysis by differential phase contrast (DPC)- scanning transmission electron microscopy (STEM) and artificial intelligence (AI) segmentation
From Root Cause to Roadmap: Leveraging Advanced (S)TEM for More Than Moore Technologies