51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Joel Long
Owner
Model World LLC
Albuquerque, NM
USA
Papers:
Electrically Active Defect Localization using X-ray-Induced Volatge Alteration (XrIVA)