52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Non-destructive Defect Localization by Lock-In-Thermography
Sunday, October 4, 2026: 1:30 PM
Dr. Sebastian Brand
,
Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
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Fault Isolation II
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