Fault Isolation II

Sunday, October 4, 2026: 1:30 PM-3:30 PM
1:30 PM
Non-destructive Defect Localization by Lock-In-Thermography
Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
1:50 PM
Defect localization methods for device characterization and yield management
Mr. Greg Johnson, Carl Zeiss Microscopy
See more of: Tutorial
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