52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Basics and Current Aspects of Scanning Electron Microscopy
Sunday, October 4, 2026: 10:20 AM
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
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Microscopy II
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