Microscopy II

Sunday, October 4, 2026: 10:20 AM-11:20 AM
10:20 AM
Basics and Current Aspects of Scanning Electron Microscopy
Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH
10:40 AM
The What, Why and How of Transmission Imaging and Diffraction in an SEM:
Jason Holm, PhD, National Institute of Standards and Technology
See more of: Tutorial
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