Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization

Sunday, October 4, 2026: 8:20 AM

Dr. Jan Neuman , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mr. Radek Dao , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mr. Ondřej Novotný , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mr. Libor Strakos , Thermo Fisher Scientific, Brno, CZ, Czech Republic

Dr. Claudiu Colbea , Thermo Fisher Scientific, Brno, Jihomoravský kraj, Czech Republic

Mr. Md Ashiqur Rahman Laskar , Arizona State University, Tempe, AZ

Mr. Willy Lim , Imina Technologies SA, Cugy, Switzerland

Mrs. Jamie D. Grawell , Thermo Fisher Scientific, Brno, Jihomoravský kraj, Czech Republic

Rosalinda Ring , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Prof. Umberto Celano , Arizona State University, Tempe, AZ

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