Sunday, October 4, 2026: 8:00 AM-10:00 AM
Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc. and Rosalinda Ring, NenoVision s. r. o.
8:20 AM
Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization
Dr. Jan Neuman, NenoVision s. r. o.;
Mr. Radek Dao, NenoVision s. r. o.;
Mr. Ondřej Novotný, NenoVision s. r. o.;
Mr. Libor Strakos, Thermo Fisher Scientific;
Dr. Claudiu Colbea, Thermo Fisher Scientific;
Mr. Md Ashiqur Rahman Laskar, Arizona State University;
Mr. Willy Lim, Imina Technologies SA;
Mrs. Jamie D. Grawell, Thermo Fisher Scientific;
Rosalinda Ring, NenoVision s. r. o.;
Prof. Umberto Celano, Arizona State University
