52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Integrated Circuit Fault Isolation Readiness For Silicon Photonics
Tuesday, October 6, 2026: 4:00 PM
Prof. Christian Boit, FASM
,
Technische Universität Berlin, Berlin, Berlin, Germany
Dr. Felix Beaudoin, FASM
,
GlobalFoundries, Malta, NY
Dr. Norbert Herfurth
,
IHP - Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Brandenburg, Germany
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Fault Isolation IV
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Tutorial