52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Fault Isolation IV
Tuesday, October 6, 2026: 4:00 PM-5:00 PM
4:00 PM
Integrated Circuit Fault Isolation Readiness For Silicon Photonics
Prof. Christian Boit, FASM
,
Technische Universität Berlin
;
Dr. Felix Beaudoin, FASM
,
GlobalFoundries
;
Dr. Norbert Herfurth
,
IHP - Leibniz Institute for High Performance Microelectronics
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