Dr. Sebastian Brand

Team Leader
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle, Saxony-Anhalt
Germany 6120

Papers:

Non-destructive Defect Localization by Lock-In-Thermography
SAM Signal Deconvolution: Extracting Transducer independent Information
Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Enhancement of Scanning Acoustic Microscopy in Robustness, Precision and Automation through AI-based signal analysis